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Publisher : edp sciences Publication : uvx 2008 - 9e colloque sur les sources coherentes et incoherentes uv, vuv et x Filter by : Subject

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High-resolution scanning coherent X-ray diffraction microscopy

Authors : Pierre Thibault; Franz Pfeiffer; Martin Dierolf

Subjects: Microscopy; Transmission function; High resolution

Source: UVX 2008 - 9e Colloque sur les Sources Cohérentes et Incohérentes UV, VUV et X : Applications et Développements Récents.

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