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Amorphous to crystalline induced CoSi2phase formation in Co-implanted Si

Subjects: Condensed Matter Physics; Instrumentation; Electronic, Optical and Magnetic Materials

  • Source: The European Physical Journal Applied Physics. 41:107-110

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X-ray diffraction study of thin film elasticity constants

Subjects: Materials Chemistry; Metals and Alloys; Physical and Theoretical Chemistry

  • Source: Revue de Métallurgie. 101:97-102

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An X-ray diffraction and Mössbauer study of interdiffusion phenomena at the interface between Fe and In0.5Ga0.5As (001)

Subjects: Condensed Matter Physics; Instrumentation; Electronic, Optical and Magnetic Materials

  • Source: European Physical Journal: Applied PhysicsEuropean Physical Journal: Applied Physics, EDP Sciences, 2003, 21 (3), pp.179-185. ⟨10.1051/epjap:2003002⟩

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Heteroepitaxy of Chemically Deposited CdS on Large Lattice Mismatched (111) GaP

Subjects: Instrumentation; Thin film; Transmission electron microscopy

  • Source: Microscopy Microanalysis Microstructures. 7:217-224

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Structural characterization of PbTi03, Sm0.6Nd0.4NiO3and NdMnO3multifunctional Perovskite thin films

Subjects: Chemical vapor deposition; Metalorganic vapour phase epitaxy; X-ray crystallography

  • Source: EPJ Web of Conferences, Vol 29, p 00009 (2012)

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X-Ray diffraction and Raman spectroscopy for a better understanding of ZnO:Al growth process

Subjects: Electrical and Electronic Engineering; Condensed Matter Physics; Renewable Energy, Sustainability and the Environment

  • Source: EPJ Photovoltaics, Vol 2, p 25002 (2012)

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X-ray method for the structural investigation of thin organic films

Subjects: Small-angle X-ray scattering; Optics; business.industry

  • Source: Journal de PhysiqueJournal de Physique, 1986, 47 (7), pp.1249-1256. ⟨10.1051/jphys:019860047070124900⟩

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EXAFS STUDY OF COPPER-HAFNIUM MULTILAYERS

Subjects: General Engineering; Hafnium; chemistry.chemical_element

  • Source: Journal de Physique ColloquesJournal de Physique Colloques, 1986, 47 (C8), pp.C8-1061-C8-1064. 〈10.1051/jphyscol:19868206〉

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MAGNETIC PROPERTIES OF FACING TARGETS SPUTTERED NdFeMo FILMS

Subjects: General Engineering; Chemistry; Thin film

  • Source: Journal de Physique ColloquesJournal de Physique Colloques, 1988, 49 (C8), pp.C8-1743-C8-1744. 〈10.1051/jphyscol:19888793〉

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Investigation of photomоdified semiconductor/ electrolyte interfaces : The n-lnSe/CulSe3-Se°/polyiodide system

Subjects: Biochemistry; Electrolyte; Copper

  • Source: Journal de Chimie Physique. 86:1265-1276

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  • 1-10 of  10 results for ""X-ray crystallography""