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Academic Journal

Superior Deep-Ultraviolet Source Pumped by an Electron Beam for NLOS Communication

Subjects: Components, Circuits, Devices and Systems; Engineered Materials, Dielectrics and Plasmas; Nonlinear optics

  • Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(8):3391-3394 Aug, 2020

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Academic Journal

Statistical Inference of Serial Communication Errors Caused by Repetitive Electromagnetic Disturbances

Subjects: Fields, Waves and Electromagnetics; Engineered Materials, Dielectrics and Plasmas; Transient analysis

  • Source: IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 62(4):1160-1168 Aug, 2020

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  • 1-10 of  49,858 results for ""communication""