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Academic Journal

Correlation of AFM/SEM/EDS Images to Discriminate Several Nanoparticle Populations Mixed in Cosmetics.

  • Source: Microscopy Today. May2021, Vol. 29 Issue 3, p46-51. 6p.

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Academic Journal

Low-Z FIB Grids for Reducing Spurious Fluorescence and X-ray Overlaps.

  • Source: Microscopy Today. Mar2022, Vol. 30 Issue 2, p24-29. 6p.

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Academic Journal

EDS Microanalysis of Unhydrated Blast Furnace Slag Grains in Field Concrete with Different Service Life.

  • Authors : Zhang Y; Microlab, Section Materials and Environment, Faculty of Civil Engineering and Geosciences, Delft University of Technology, Delft, The Netherlands.; Saravanakumar K

  • Source: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2022 Jun 01, pp. Publisher: Cambridge University Press Country of Publication: United States NLM ID: 9712707 Publication Model: Print-Electronic

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Academic Journal

Cluster Analysis of Combined EDS and EBSD Data to Solve Ambiguous Phase Identifications.

  • Authors : Parish CM; Nuclear Energy Materials Microanalysis Group, Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA.

  • Source: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2022 Mar 03, pp. Publisher: Cambridge University Press Country of Publication: United States NLM ID: 9712707 Publication Model: Print-Electronic

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Academic Journal

Reproducible Spectrum and Hyperspectrum Data Analysis Using NeXL.

  • Authors : Ritchie NWM; Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD20899-8371, USA.

  • Source: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada [Microsc Microanal] 2022 Mar 02, pp. Publisher: Cambridge University Press Country of Publication: United States NLM ID: 9712707 Publication Model: Print-Electronic

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  • 1-10 of  23 results for "eds"