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Academic Journal

Tool Wear Estimation in End Milling of Titanium Alloy Using NPE and a Novel WOA-SVM Model

Subjects: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems; Tools

  • Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 69(7):5219-5232 Jul, 2020

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Academic Journal

An 8-bit Low-Cost String DAC With Gradient Errors Suppression to Achieve 16-bit Linearity

Subjects: Components, Circuits, Devices and Systems; Resistors; Linearity

  • Source: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 67(7):2157-2168 Jul, 2020

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Academic Journal

MIRE: A Multitone Identification and Replacement Method for Multitone Spectral Test Without Requiring Coherent Sampling

Subjects: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems; Discrete Fourier transforms

  • Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 69(7):4578-4591 Jul, 2020

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Academic Journal

A Critical Current Measurement Method for Strip Hard Superconductors Utilizing Pulsed Current

Subjects: Fields, Waves and Electromagnetics; Engineered Materials, Dielectrics and Plasmas; High-temperature superconductors

  • Source: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 30(4):1-5 Jun, 2020

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Academic Journal

Remote-Sensing Image Superresolution Based on Visual Saliency Analysis and Unequal Reconstruction Networks

Subjects: Geoscience; Signal Processing and Analysis; Image reconstruction

  • Source: IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 58(6):4099-4115 Jun, 2020

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Academic Journal

An Initial Orbit Determination Method Using Single-Site Very Short Arc Radar Observations

Subjects: Aerospace; Transportation; Space vehicles

  • Source: IEEE Transactions on Aerospace and Electronic Systems IEEE Trans. Aerosp. Electron. Syst. Aerospace and Electronic Systems, IEEE Transactions on. 56(3):1856-1872 Jun, 2020

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Academic Journal

A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test

Subjects: Power, Energy and Industry Applications; Components, Circuits, Devices and Systems; Signal generators

  • Source: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 69(6):3516-3526 Jun, 2020

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  • 1-10 of  42,415 results for ""Chen, D.""