Thermal stability of VSe2 investigated by in situ transmission electron microscope

• Authors : Ye, Changqing; Liu, Dongming; Shen, Junhao

• Source: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on

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Imaging Using Mems Electron Microscope

• Authors : Krysztof, Michal; Bialas, Marcin; Grzebyk, Tomasz

• Source: 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2023 IEEE 36th International. :32-34 Jul, 2023

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Imaging of Cerebral Angiogenesis in Mice Brain after Ischemic Stroke Based on the X-ray Microscope and Scanning Electron Microscope

• Authors : Zhao, Denghui; Tang, Yaohui; Miao, Peng

• Source: 2023 11th International Conference on Bioinformatics and Computational Biology (ICBCB) Bioinformatics and Computational Biology (ICBCB), 2023 11th International Conference on. :203-207 Apr, 2023

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Material Compound-Property Retrieval Using Electron Microscope Images for Rubber Material Development

• Authors : Yanagi, R.; Togo, R.; Maeda, K.

• Source: IEEE Access Access, IEEE. 11:88258-88264 2023

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Boundary Enhanced Semantic Segmentation for High Resolution Electron Microscope Images

• Authors : Pollach, Matthias; Schiegg, Felix; Ludwig, Matthias

• Source: 2022 30th European Signal Processing Conference (EUSIPCO) European Signal Processing Conference (EUSIPCO), 2022 30th. :523-527 Aug, 2022

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Design of a Control System for Precision Two-Dimensional Positioning Platform of Small Desktop Scanning Electron Microscope

• Authors : Zhang, Hui; Bi, Yicheng; Wang, Zuye

• Source: 2023 5th International Conference on Intelligent Control, Measurement and Signal Processing (ICMSP) Intelligent Control, Measurement and Signal Processing (ICMSP), 2023 5th International Conference

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A LAB6 Nanoneedle Field-Emission Electron Source for Stable Imaging with Atomic Resolution in a Transmission Electron Microscope

• Authors : Tang, Shuai; Tang, Jie; Okunishi, Eiji

• Source: 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2023 IEEE 36th International. :163-165 Jul, 2023

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Electron-Photon Interactions in a Scanning Electron Microscope

• Authors : Simonaitis, John W.; Krielaart, Maurice A. R.; Koppell, Stewart A.

• Source: 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2023 IEEE 36th International. :9-11 Jul, 2023

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Coulomb-Correlated Few-Electron States in a Transmission Electron Microscope Beam

• Authors : Haindl, Rudolf; Feist, Armin; Domrose, Till

• Source: 2023 IEEE 36th International Vacuum Nanoelectronics Conference (IVNC) Vacuum Nanoelectronics Conference (IVNC), 2023 IEEE 36th International. :17-19 Jul, 2023

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High-voltage engineering in vacuum and with electron beams for scanning electron microscope

• Authors : Matsunaga, Soichiro; Doi, Takashi

• Source: 2023 30th International Symposium on Discharges and Electrical Insulation in Vacuum (ISDEIV) Discharges and Electrical Insulation in Vacuum (ISDEIV), 2023 30th International Symposium on. :556-559

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