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Academic Journal

Consensus of Singular Linear Multiagent Systems Via Hybrid Control

  • Source: IEEE Transactions on Control of Network Systems IEEE Trans. Control Netw. Syst. Control of Network Systems, IEEE Transactions on. 9(2):647-656 Jun, 2022

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Academic Journal

A Quantitative Analysis and Optimization on the Cache Behavior Influenced by Literal Pools

  • Source: IEEE Embedded Systems Letters IEEE Embedded Syst. Lett. Embedded Systems Letters, IEEE. 14(2):95-98 Jun, 2022

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Academic Journal

Real-Valued Variational Bayesian Inference for Direction-of-Arrival Estimation

  • Source: IEEE Sensors Letters IEEE Sens. Lett. Sensors Letters, IEEE. 6(6):1-4 Jun, 2022

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A Soft Error Detection and Recovery Flip-Flop for Aggressive Designs With High-Performance

  • Source: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(2):223-231 Jun, 2022

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Academic Journal

Compressed Channel Estimation for IRS-Assisted Millimeter Wave OFDM Systems: A Low-Rank Tensor Decomposition-Based Approach

  • Source: IEEE Wireless Communications Letters IEEE Wireless Commun. Lett. Wireless Communications Letters, IEEE. 11(6):1258-1262 Jun, 2022

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Academic Journal

On/Off Switching of Valley Topological Edge States in the Terahertz Region

  • Source: IEEE Photonics Journal IEEE Photonics J. Photonics Journal, IEEE. 14(3):1-6 Jun, 2022

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Academic Journal

Microwave Diagnostics of Cold Atmospheric Pressure Plasma Jets Based on the Radiation Pattern Measurements

  • Source: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 50(6):1669-1674 Jun, 2022

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ViP: A Hierarchical Parallel Vision Processor for Hybrid Vision Chip

  • Source: IEEE Transactions on Circuits and Systems II: Express Briefs IEEE Trans. Circuits Syst. II Circuits and Systems II: Express Briefs, IEEE Transactions on. 69(6):2957-2961 Jun, 2022

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Academic Journal

A Fault Detection Method for Partial Chip Failure in Multichip IGBT Modules Based on Turn-Off Delay Time

  • Source: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(6):3319-3327 Jun, 2022

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  • 1-10 of  240,252 results for ""Li, H.""