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Electrostatic forces between a metallic tip and semiconductor surfaces

Subjects: Instrumentation; Microscope; law.invention

  • Source: Journal de Physique IJournal de Physique I, EDP Sciences, 1994, 4 (11), pp.1725-1742. 〈10.1051/jp1:1994217〉

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TEM investigation of iron segregation modes in CuAlFe dilute alloys

Subjects: Instrumentation; Metallurgy; Transmission electron microscopy

  • Source: Microscopy Microanalysis MicrostructuresMicroscopy Microanalysis Microstructures, EDP Sciences, 1994,

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Some Aspects of Coherent Epitaxial Deposits

Subjects: Instrumentation; Wetting; Surface energy

  • Source: Microscopy Microanalysis MicrostructuresMicroscopy Microanalysis Microstructures, EDP Sciences, 1997,

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  • 1-10 of  119 results for ""Physics""