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Academic Journal

Ciliary Ultrastructure Assessed by Transmission Electron Microscopy in Adults with Bronchiectasis and Suspected Primary Ciliary Dyskinesia but Inconclusive Genotype.

Authors : Staar, Ben O.^1,2,3 (AUTHOR) ; Hegermann, Jan^2,4 (AUTHOR) ; Auber, Bernd⁵ (AUTHOR)

Source: Cells (2073-4409). Nov2023, Vol. 12 Issue 22, p2651. 14p.

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Academic Journal

SimpliPyTEM: An open-source Python library and app to simplify transmission electron microscopy and in situ-TEM image analysis.

Authors : Ing, Gabriel¹ (AUTHOR) ; Stewart, Andrew² (AUTHOR); Battaglia, Guiseppe^3,4 (AUTHOR)

Source: PLoS ONE. 10/5/2023, Vol. 18 Issue 10, p1-13. 13p.

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Academic Journal

Transmission Electron Microscopy Peeled Surface Defect of Perovskite Quantum Dots to Improve Crystal Structure.

Authors : Yuan, Longfei¹ (AUTHOR) ; Zhou, Taixin¹ (AUTHOR) ; Jin, Fengmin¹ (AUTHOR)

Source: Materials (1996-1944). Sep2023, Vol. 16 Issue 17, p6010. 8p.

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Academic Journal

A Multiscale Deep‐Learning Model for Atom Identification from Low‐Signal‐to‐Noise‐Ratio Transmission Electron Microscopy Images.

Authors : Lin, Yanyu¹ (AUTHOR); Yan, Zhangyuan² (AUTHOR); Tsang, Chi Shing² (AUTHOR)

Source: Small Science. Aug2023, Vol. 3 Issue 8, p1-10. 10p.

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Academic Journal

High-resolution three-dimensional structural determination of unstained double-gyroid block copolymers through scanning transmission electron microscopy.

Authors : Chen, Ying¹ (AUTHOR); Yang, Jhih-Heng¹ (AUTHOR); Chang, Ya-Ting² (AUTHOR)

Source: Scientific Reports. 7/26/2023, Vol. 13 Issue 1, p1-9. 9p.

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Academic Journal

Goethite Mineral Dissolution to Probe the Chemistry of Radiolytic Water in Liquid‐Phase Transmission Electron Microscopy.

Authors : Couasnon, Thaïs¹ (AUTHOR) ; Fritsch, Birk^2,3,4 (AUTHOR); Jank, Michael P. M.⁵ (AUTHOR)

Source: Advanced Science. 9/5/2023, Vol. 10 Issue 25, p1-10. 10p.

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Conference

Deep Learning for Analysis of Two-Dimensional Materials in High-Resolution Transmission Electron Microscopy Image

Authors : Sheng, Zhiwei; Xie, Jing; Zhang, Shiyi

Source: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on

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Conference

Combining 4D Scanning Transmission Electron Microscopy and Electron Precession for Mapping of Electric Field at the Nanoscale Over Large Field of View

Authors : Cao, Shaohong; Liang, Chao; Xu, Houqiang

Source: 2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2023 IEEE International Symposium on

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Academic Journal

Determine the Complete Configuration of Single‐Walled Carbon Nanotubes by One Photograph of Transmission Electron Microscopy.

Authors : Yu, Yue¹ (AUTHOR); Zhao, Yifan² (AUTHOR); Li, Shouheng^1,3 (AUTHOR)

Source: Advanced Science. 5/26/2023, Vol. 10 Issue 15, p1-10. 10p.

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Academic Journal

Revealing the Electrochemistry of All-Solid-State Li-SeS 2 Battery via Transmission Electron Microscopy.

Authors : Yan, Rui¹ (AUTHOR) ; Liu, Fangchao¹ (AUTHOR) ; Fu, Zhengwen² (AUTHOR)

Source: Inorganics. Jun2023, Vol. 11 Issue 6, p257. 9p.

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