La cristallographie aux rayons X

• Authors : William Clegg

Subjects: X-ray crystallographySCIENCE / Physics / Crystallography

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Opportunities and challenges in neutron crystallography.

• Authors : Combet, S.; Schirò, G.; Zaccai, Nathan Richard¹

• Source: EPJ Web of Conferences. 7/1/2020, Vol. 236, p1-22. 22p.

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An introduction to neutrons for biology.

• Authors : Combet, S.¹ ; Schirò, G.¹; Combet, Sophie¹

• Source: EPJ Web of Conferences. 7/1/2020, Vol. 236, p1-18. 18p.

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Crystal structure, NMR study, dc-conductivity and dielectric relaxation studies of a new compound [C2H10N2]Cd(SCN)2Cl2.

• Authors : Saidi, K.¹ ; Kamoun, S.¹; Ayedi, H. F.¹

• Source: EPJ Web of Conferences. 2012, Issue 29, p00031-p.1-00031-p.11. 11p.

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Chapter 7: X-ray diffraction and glass-ceramic materials

• Authors : Philippe Deniard

Subjects: Glass-ceramic; law.invention; law

• Source: From glass to crystal

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Hydration behavior by X-ray diffraction profile fitting of smectite-bearing minerals

• Authors : Ruarri J. Day-Stirrat; L. Taras Bryndzia

Subjects: lcsh:Environmental sciences; lcsh:GE1-350; Materials science

• Source: E3S Web of Conferences, Vol 205, p 04009 (2020)

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Preparation and microwave properties of ZnTiNb2O8/SmTiNbO6 composite dielectric ceramics

• Authors : Ke Lei

Subjects: Ceramic; visual_art.visual_art_medium; visual_art

• Source: E3S Web of Conferences, Vol 268, p 01079 (2021)

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X-ray diffraction analysis of a sintered product made of electroerosive chromium-containing powder

• Authors : E.V. Ageeva; V.I. Kolmykov; S.V. Khardikov

Subjects: Metallurgy; Chromium; chemistry.chemical_element

• Source: MATEC Web of Conferences, Vol 344, p 01008 (2021)

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X-ray diffraction analysis of products sintered from isostatically pressed leaded bronze powders

• Authors : Evgeny Ageev; Anton Pereverzev

Subjects: lcsh:Engineering (General). Civil engineering (General); lcsh:TA1-2040; Metallurgy

• Source: MATEC Web of Conferences, Vol 298, p 00037 (2019)

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Precision of the Residual Stress determined by X-ray Diffraction: Summery and Limits

• Authors : Eckehard Mueller

Subjects: Optics; business.industry; business

• Source: 19th International Congress of Metrology (CIM2019).

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